| 摘要 |
PURPOSE:To synchronize test the cycle with high accuracy, and also to easily control a program of a test pattern generator without making it complicated, by providing a timing generator, and supplying this output as a trigger signal to a general purpose measuring instrument. CONSTITUTION:A titled device is provided with a timing generator TTG for supplying a trigger signal TR to a general purpose measuring instrument EXM, and is constituted so that a reference clock signal outputted by a test cycle time generator TCP is supplied, is controlled by a central processor CPU, and the trigger signal TR for the general purpose measuring instrument EXM is obtained. An internal delay time 4t of the general purpose measuring instrument EXM is compensated by inputting a dummy test cycle TCP0 to the first part of a test cycle. The time of this dummy test cycle TCP0 must be made a dummy test cycle to a device to be tested DUT, therefore, an output of the timing generator for the device to be tested is stopped by a test pattern generator PG, and a clock signal D for the device to be tested DUT is stopped. |
