发明名称 CONSTANT TEMPERATURE TESTING DEVICE
摘要 PURPOSE:To eliminate the need for wasteful change of the temp. in a constant temperature device and to reduce the loss of time and energy, by enabling charging and removing of an object to be tested while electrical conditions thereof are maintained. CONSTITUTION:Prescribed electrical conditions for an object 1 to be tested can be obtained from either a power source device 3 or a power source devide 5 or simultaneously from both, and can be connected or disconnected to or from a connector 4 and a connector 6 as desired. Therefore, the object 1 is connected by the connector 6 to the device 5 while the temp. conditions in a constant temp. device 2 is maintained in a set position. The object 1 maintained under the prescribed electrical conditions is fed into the device 2, and is then connected to the power source 3 set at the prescribed electrical conditions by the connector 4. The device 5 is thereafter disconnected from the object by the connector 4. In the stage of removing, the device 5 is set at the prescribed electrical conditions and is connected to the object 1 by the connector 6 and the connector 4 is disconnected from the object, whereby the object is removed under the state of satisfying the electrical conditions from the inside of the device 2.
申请公布号 JPS58179340(A) 申请公布日期 1983.10.20
申请号 JP19820063143 申请日期 1982.04.15
申请人 NIPPON DENKI KK 发明人 ISHIGURO HIDEO;SAITOU NAOAKI
分类号 G01R31/30;G01N17/00;G01R31/00 主分类号 G01R31/30
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