| 摘要 |
PURPOSE:To reduce the influence of an apparent sensitivity variation by an intensity distribution of incident light, and to improve the accuracy for measuring an absolute value of intensity of the incident light, by integrating an output of an image sensor by an integrator, and correcting the sensitivity of the output of the image sensor in accordance with this integral value, in an optical device for measuring a quality and a state of a temperature pattern, etc. CONSTITUTION:Incident light from a measuring object 1 is made incident to an image sensor 3, an output of at least one scanning portion of the image sensor is amplified through an amplifier 4, it is integrated by opening a switch of an integrator 5 only during this time, and its final output is sample-held in a sample holding circuit 6. An output of this sample holding circuit 6 is supplied to a function generator 71 of a correcting circuit 7, and the function generator 71 supplies an AGC signal for obtaining prescribed sensitivity, to an AGC circuit 72. Subsequently, in the following scanning of the image sensor 3, an output of each element of the image sensor 3 is supplied to the AGC circuit 72 of the correcting circuit 7 through the amplifier 4, and the automatic gain control is executed by the AGC signal of the function generator 71, and a signal corrected so as to become prescribed sensitivity is fetched from an output terminal 8. In this way, the sensitivity of an input signal is corrected in accordance with an integral output by at least one scanning, therefore, an output of correct sensitivity is obtained. |
