发明名称 AUTOMATIC FINE REGULATION SYSTEM FOR MASS ANALYTIC MAGNETIC FIELD IN CASE OF ION IMPLANTATION DEVICE
摘要 PURPOSE:To make the peak of beam strength findable in a speedy manner without any scanning of an analytic magnetic field so as to aim at the promptitude of regulation, by installing a coule of electrostatic deflecting plates in an interspace between an analyzer magnet and an nalyzer slit. CONSTITUTION:During beam lining, a couple of electrostatic deflecting plates 5 are installed in an interspace between an analyzer magnet 2 and a slit 3 while an AC signal from an oscillator 6 is impressed on these plates 5 and thereby an ion beam 1 is slightly oscillated in the same inner surface as being deflected by the analyzer magnet 2. At this time, the value of a current flowing into a target 4 is phase-detected by a phase wave detector 7 by regarding the AC signal from the oscillator 6 as a reference signal whereby, before the AC signal is impressed on these deflecting plates 5, that is, when the ion beam 1 is not yet deflected by these deflecting plates 5, an error signal (e) proportioned to a positional slippage in the beam 1 in relation to the central part of the slit 3 is secured at an output port 8. Using this error signal (e), an analyzer magnet power source 9 is conducted with negative feedback whereby an analytic magnetic field is minutely regulated so as to get the peak value of a beam current.
申请公布号 JPS58178950(A) 申请公布日期 1983.10.20
申请号 JP19820060605 申请日期 1982.04.12
申请人 NIPPON DENKI KK 发明人 TSUNENARI KINJI
分类号 H01J37/20;G01N27/62;H01J37/05;H01J37/317;H01J49/20 主分类号 H01J37/20
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