| 摘要 |
A circuit arrangement utilises pairs of diodes (D1a, D1b, D2a, D2b) for enabling simultaneous testing by means of a test push button (T) of independent AC circuits (Sa, L1; S2, L2). Upon operation of the test push button (T) power is supplied to each of the independent AC circuits (S1, L1; S2, L2), via respective diode pairs (D1a, D1b, D2a, D2b) to operate each of the independent AC circuits (S1, L1; S2, L2) simultaneously whilst in normal operation the diodes (D1a, D1b, D2a, D2b) ensure that the AC circuits are maintained independent from one another. Similar diode pairs are utilised for electrically isolating forward and reverse inputs of capacitors split phase motors M1, M2) driven in parallel to prevent capacitor feedback overriding end-of-travel switches of each of the motors. |
