| 摘要 |
PROBLEM TO BE SOLVED: To provide a measuring method of residual stress having a high measurement accuracy.SOLUTION: In the measuring method of residual stress, using an X-ray diffraction method, the residual stress of a surface treatment article (1) including a surface treatment layer (1b) and a base material layer (1a) covered with the surface treatment layer (1b) is measured. The measuring method of residual stress includes a crushing step (S13) and a step (S15) of deriving a crystal lattice surface interval dof the surface treatment layer (1b). In the crushing step (S13), the surface treatment layer (1b) is crushed to a crystal size so that the residual stress of the surface treatment layer (1b) substantially becomes 0.SELECTED DRAWING: Figure 1 |
