发明名称 SHORT-TERM JUDGMENT OF FREEZE RESISTANCE OF YEAST
摘要 <p>PURPOSE:To judge the freeze resistance of yeast in an extremely short period securely, by cultivating a yeast to be tested, freezing the crude fermented substance of the yeast in a germination state, preserving it for a fixed period, thawing it, detecting the live ratio of the yeast to be tested. CONSTITUTION:A yeast to be tested is fermented in a medium containing a saccharide such as sucrose, glucose, etc., the crude fermented substance of the yeast wherein the yeast to be tested in a germination state is frozen at -35- -45 deg.C, preferably at -40 deg.C, preserved for about 1-150hr, preferably 1-4days, thawed, and the live ratio of the yeast to be tested is detected by using a methylene blue dyed solution.</p>
申请公布号 JPS58170497(A) 申请公布日期 1983.10.07
申请号 JP19820051126 申请日期 1982.03.31
申请人 ORIENTAL KOBO KOGYO KK 发明人 SAITOU HIROSHI;SHIMADA SHIYOUJI;SAEKI TAKAMICHI
分类号 C12N1/16;C12Q1/04;C12Q1/06;C12R1/85 主分类号 C12N1/16
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