发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 PURPOSE:To maintain a charged particle beam focused onto a sample or a material always to a desired diameter, by constituting a device such that an obtaining means of ratio of lead out voltage to accelerating voltage and a generating means of a control signal in accordance with the obtained ratio are equipped to control a power source of a lens by the control signal. CONSTITUTION:An ion beam is focused once to a point P in the drawing by lens action of a lead out electrode 5 and accelerating electrode 6. The accelerated ion beam is partially detected by an ion detector 9, and the detected signal, after being amplified, is compared with reference voltage from a variable power source 12 in a differential amplifier 11. Here if a quantity of the accelerated ion beam changes, a signal is generated from the amplifier 11. A difference signal is supplied to a lead out power source 8, and lead out voltage applied to the electrode 5 is controlled in such a manner that said difference signal becomes 0, that is, the ion beam quantity always becomes constant.
申请公布号 JPS58169854(A) 申请公布日期 1983.10.06
申请号 JP19820052550 申请日期 1982.03.31
申请人 NIPPON DENSHI KK 发明人 AIHARA RIYUUZOU
分类号 H01J37/073;H01J37/24;H01J37/248 主分类号 H01J37/073
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