发明名称 |
APPARATUS FOR MEASURING THE POLLUTION LEVEL OF THE PHOTOVOLTAIC MODULES SURFACE |
摘要 |
The present invention provides an apparatus for measuring a contamination level of a photovoltaic module surface which detects a change in resistance on a surface of a photovoltaic module to efficiently measure a degree of contamination accumulated on the module surface and secures an optimal cleaning period of the module during photovoltaic power generation. The apparatus for measuring a contamination level of a photovoltaic module surface comprises: a glass substrate which can be attached to a surface of a photovoltaic module; a reaction coating layer which is coated on one surface of the glass substrate, has a structure where a contaminant can be accumulated on a surface on one side thereof, and causes a change in resistance by a contact with the contaminant; and a signal processor connected to the reaction coating layer to receive a signal of a resistance change and process the signal of the reaction coating layer to measure an amount of change in a resistance value from the resistance change by accumulating the contaminant and then output a determination signal about whether the reaction coating layer is contaminated. |
申请公布号 |
KR20160107489(A) |
申请公布日期 |
2016.09.19 |
申请号 |
KR20150030272 |
申请日期 |
2015.03.04 |
申请人 |
MAIN-ENERGIA CO., LTD. |
发明人 |
SHIN, SUK HO;KIM, TAIK NAM |
分类号 |
H02S50/10;G01R27/00;G08B5/36;G08B21/18;G08C17/02;H01B1/02 |
主分类号 |
H02S50/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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