发明名称 MEASURING METHOD OF SURFACE TEMPERATURE DISTRIBUTION OF MATERIAL
摘要 PURPOSE:To improve a measuring range and accuracy, by scanning a licenser camera in a period suitable for temperature of a material and measuring the temperature distribution of the material and then, combining the value of this temperature distribution with the absolute value of the temperature obtained by a radiation thermometer which is provided separately. CONSTITUTION:A licenser camera 2 directed toward a moving mterial 1 is provided and also, a radiation thermometer 3 is disposed as directing toward the middle point of a scanning line crossing at right angles to its moving direction. The scanning for each element of the camera 2 is carried out with high speed and a period of the scanning is varied by instructions of an operational processing device 6 basing on a signal obtained by digitalizing the output signal of the camera 2 by an A/D converter 5 and is automatically controlled to have a period suitable for the temperature of the material. On one hand, the signal of the thermometer 3 is inputted into the device 6 through an A/D converter 8 because the absolute value of the temperature is not made known by only the camera 2. Then, said signal is compared with the result obtained by the camera 2 and is outputted into a display device 9 after correcting a temperature drift etc. of the camera 2.
申请公布号 JPS58168926(A) 申请公布日期 1983.10.05
申请号 JP19820051644 申请日期 1982.03.30
申请人 SUMITOMO KINZOKU KOGYO KK 发明人 MATSUI KENICHI;HIROSHIMA TATSUO
分类号 G01J5/48;G01J5/00 主分类号 G01J5/48
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