Field service test for an electronic control.

摘要

A field service test for an electronic control and apparatus for accomplishing that test are disclosed. The electronic control includes a microprocessor incorporating test logic therein. A passive test device is provided for connecting the outputs and inputs of the microprocessor control such that upon an initiating test signal being provided the internal test logic within the control generates a series of outputs which are circuited to the inputs of the microprocessor where they are compared to known values to determine whether or not the microprocessor is performing appropriately. Means are provided for generating an alarm signal upon an error being detected in the microprocessor operation.