发明名称 TEST PATTERN PROJECTOR
摘要 PURPOSE:To simplify the control of color temperatures and also to obtain an even color temperature, by performing a rough control of the color temperature with a filter turret and then a fine control with the inclination of an interference film filter. CONSTITUTION:A filter turret 21 is turned by an external operation, a motor, etc. to select a desired color temperature converting filter. A rough control is given through the turret 21 to the color temperature of the illumination light given from a light source 16. Then the inclination is changed for red and blue cutting filters 18 and 19 by turning a knob 23 or 24. The wavelength region to be cut varies in response to the change of inclination of filters 18 and 19. This enables a fine control of the color temperature of the illumination light. After the control of the color temperature, each test pattern chart is put into an optical axis. Then a controller is operated while observing a picked-up chart image to ensure good quality of color pictures.
申请公布号 JPS58166894(A) 申请公布日期 1983.10.03
申请号 JP19820048828 申请日期 1982.03.29
申请人 FUJI SHASHIN KOKI KK 发明人 SATOU KIYOSHI;MATSUI NOBUO
分类号 G03B21/00;H04N9/04;H04N17/02 主分类号 G03B21/00
代理机构 代理人
主权项
地址