发明名称 MEASURING SYSTEM OF TEMPERATURE
摘要 PURPOSE:To know accurately a temperature of a material to be treated, by placing a dummy of the material to be treated formed by embedding a heat sensitive part on a susceptor similarly to the material to be treated and measuring its temperature. CONSTITUTION:A semiconductor wafer 1 is housed in recessed parts 2a of a susceptor 2 and also, a wafer dummy 3 having the same figure is housed in one of the parts 2a. A thermocouple part 41 of a thermocouple thermometer 4 is embedded in the dummy 3 and the temperature is displayed on a display part 43 through a lead wire 42 and the accurate temperature of the wafer 1 is known.
申请公布号 JPS58166228(A) 申请公布日期 1983.10.01
申请号 JP19820049692 申请日期 1982.03.26
申请人 PIONEER KK 发明人 TAKURA MASAYUKI
分类号 G01K7/00;G01K1/14 主分类号 G01K7/00
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