| 摘要 |
PURPOSE:To detect a defect in an intricately shaped position easily, by erasing an echo generated at the same time as the stored generation time among the echoes obtained by subjecting ultrasonic flaw detection to a defect-free sample of the same shape as the shape of an object to be tested beforehand. CONSTITUTION:A pulser 3 is connected to a contactor 1, and the contactor 1 is excited by the pulser 3 so as to transmit a ultrasonic wave to an object to be tested. A defect-free sample of the same shape as the shape of the object to be tested is subjected beforehand to ultrasonic flaw detection at the flaw detecting position of the object to be tested and the generation time of an echo obtained by the detection is stored. The echo of the same generation time as the previously stored generation time is erased among the echoes obtained by subjecting the object to be tested to ultrasonic flaw detection. The echo due to the defect of the object to be tested is thus removed, and the defect in the intricately shaped position is detected easily. |
