| 摘要 |
PURPOSE:To shorten the time required for making a bubble transferring test, by installing a contiguous disk pattern of a short bit to the blank space of the transferring path of each bubble element. CONSTITUTION:Each transferring loop pattern composed of minor loops 11 and a major line 12 is installed to a chip of bubble element 10 and patterns 15 are installed to the blank space of the chip 10. The pattern 15 is a contiguous disk pattern of a short loop pattern 21 which is parallel to the minor loop 11. By making the transferring loop shorter, the bubble transferring test can be made easily in a short time. |
