发明名称 Method of forming fusible links in a semiconductor device.
摘要 <p>A method of producing a semiconductor device provided with a fuse comprises the steps of forming a fuse layer (34) on an insulating layer (32) lying on a semiconductor substrate (31); forming an interrupting layer (40) covering the fuse layer and the insulating layer; forming an insulating protective layer (43) covering the interrupting layer; selectively etching the protective layer, so as to form a partial window (55), with a suitable etchant which does not etch the interrupting layer (40); and etching the exposed interrupting layer to complete the window (56) through which a portion of the fuse layer (34) and a portion of the insulating layer (32) are exposed. The insulating layer (32) is not removed, so that the reliability of the semiconductor device will not deteriorate.</p>
申请公布号 EP0089814(A2) 申请公布日期 1983.09.28
申请号 EP19830301490 申请日期 1983.03.17
申请人 FUJITSU LIMITED 发明人 YABU, TAKASHI;KANAZAWA, MASAO
分类号 G11C17/06;G11C17/14;H01L21/82;H01L21/8242;H01L23/525;H01L27/10;H01L27/108;(IPC1-7):01L23/52;01L21/90 主分类号 G11C17/06
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