| 摘要 |
PURPOSE:To obtain the distribution of a specific element about any transverse section in a non-distruction and non-contact manner by rotating a radiation source centered on a test piece so that a radiation beam can scan a required transverse section of the test piece given times from different directions. CONSTITUTION:A radiation 14 irradiates a test piece 1 and the intensity of fluorescent X ray 15 of a specified wavelength is detected 16 about those fluorescent X rays 15 radiated from the test piece 1 to perform an element analysis of the test piece 1. A radiation source 12 is rotated centered on the test piece 1 so that a radiation beam 14 scans a required transverse section 2 of the test piece 1 at least three times from different directions and detects 16 the intensity distribution along the scan line of the fluorescent X rays 15 of the specified wavelength at each scanning to be memorized into a computer 25. A plurality of intensity distributions thus obtained are computed and synthesized with the computer 25 to determine a distribution of elements corresponding to the X ray 15 of the specified wavelength on the transverse section 2. |
