| 摘要 |
<p>PURPOSE:To detect a short circuit in wiring and double selection fault by using an array of alternate ''1'' and ''0'', or low and high levels as a dummy cell pattern for inspection and taking a test of functions. CONSTITUTION:As an arrangement of an inspecting cell, transistors and diodes are arranged alternately for, for example, a junction destructive type PROM. In other general ROM devices, memory cells are arranged so that pieces of information on a high and a low level are arrayed alternately. Thus, a short circuit in wiring and the double selection fault of a memory cell are detected.</p> |
