| 摘要 |
<p>The circuit cards may be easily re-configured so that biasing arrangements can be changed from one test-device type to another without the need to fabricate new bias-circuit boards. Two cards (10,50) are used in the system. The main board (10) holds a socket which carries the test device (70) and the second card (50) has a grid of parallel tracks with an array of open-ended jack sockets which is superposed over the lower board. Each pin-position of the test device has a separate jack socket and there are three adjacent rows of sockets which may be connected to the device pin by wire jumper leads or ancillary components. Printed circuit tracks lead away from each device pin and run to columns of socket jacks. The columns lie exactly beneath the rows of jacks on the second card. Linking jacks (7,8,29) or bias components (76), such as resistors and capacitors, can be inserted into the jack sockets with upper matrix of rows to make connections within columns beneath. An edge connector (40) communicates external signal and power supplies.</p> |
