| 摘要 |
The present invention provides what is essentially a switch (10) that may detachably be connected to a chosen part of an electronic circuit to be tested in which a fault is to be produced, the switch being activated-closed-to induce the test fault, and then being removed after the test has been run. The switch itself is essentially a pair of contacts (15) supported on a substrate (13) which can be removably mounted on a predetermined circuit component (11) so that the switch is linked across two of the component's connector elements (12) and so shorts the component out when the two contacts are allowed to close following withdrawal of separator means (23) previously keeping the contacts apart. This method allows the fault to be simply induced in a circuit which is in operation in a cramped environment. <IMAGE> |
