发明名称 X-RAY FLUOROSCOPIC ANALYSIS USING FINE POWDERY SAMPLE
摘要 PURPOSE:To make it possible to simply analyze a fine powdery sample, by adhering the fine powdery sample to the surface of a substrate having an adhesive applied to the surface thereof. CONSTITUTION:The surface of a substrate 8 is coated with an adhesive 7 and the coated substrate is subsequently adhered to the under surface of a mask 2. a fine powder 9 to be analyzed is uniformly scattered on the adhesive coated surface of the central part thereof not contacted with the surface of the mask 2 uniformly as possible. When the fine powdery sample to be analyzed is excessive, the sample is diffused to be adhered uniformly as possible by imparting manual or mechanical vibration to the same after scattering and, when the unadhered excessive fine powdery sample is present, the substrate is turned over to remove the same.
申请公布号 JPS58158546(A) 申请公布日期 1983.09.20
申请号 JP19820041483 申请日期 1982.03.16
申请人 SHIN NIPPON SEITETSU KK 发明人 TAKAMI HIDEO;MATSUMOTO KAZUHIKO;TAKEI KAZUAKI
分类号 G01N23/223;G01N23/22 主分类号 G01N23/223
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