| 摘要 |
Electrical connector testing apparatus for detecting obstructions in the connector contact terminal pin receptacle channels caused by defective receptacle blades (18, 19). A carriage (22) for retaining a connector (20) in an upright position is movable between upper and lower horizontal members (40, 41) of a detection frame (36) to position the contact receptacles (16, 17) row by row between corresponding pairs of light emitting diodes and phototransistors (45, 44) fitted respectively in the horizontal members (40, 41). Light beams generated by the diodes (45) pass unobstructed through properly fitted contact receptacles (16) and are interrupted by receptacles (17) having defective, bent blades. The phototransistors (44) detect the unobstructed light beams and transmit signals indicative of properly fitted receptacles (16) to control circuitry (65), which may conveniently comprise a microprocessor, which may then be programmed to initiate appropriate action for the identification of the defective connector.
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