| 摘要 |
PURPOSE:To eliminate an unnecessary image and display only the normal image of a defect part sharply, by displaying the image of the defect part in the inside of an object to be examined with high resolution by the use of an aperture synthesis method and changing the frequency of a ultrasonic wave at every measurement point. CONSTITUTION:The ultrasonic waves differing with each of plural measurement points X1,X2...Xn are irradiated from a probe 101 in the range spreading in a circular conical shape toward the inside of an object 102 to be inspected. The probe 101 receives the reflected waves from the point A at the points X1,X2... Xn and transmits the signals thereof to respective processing circuits 106-1... 106-n for aperture synthesis signals. Thereupon, the circuits 106-1...106-n convert the signals from the probe 101 to image signals and output said signals to memories 107-1...107-n. The image signals made with the circuits 106-1...106-n are inputted to a processing circuit 108 for addition of images, by which said signals are added. The periods of the image signals in this stage differ from each other; therefore, only the normal images having no unnecessary images are displayed sharply on an image display 109. |
