发明名称 All implanted MOS transistor
摘要 A MOSFET structure having DMOS characteristics fabricated using all implantation only without the use of time-consuming diffusion. Particularly the critical length of the channel is controlled by beveling one edge of an oxide layer to a predetermined slope thereby allowing transferral of ions to the substrate through the beveled edge only to a predetermined depth thereof before being completely shielded. The result is a channel having a closely controlled length to thus be relatively very short for very fast switching of low or high voltage signals.
申请公布号 US4404576(A) 申请公布日期 1983.09.13
申请号 US19800157744 申请日期 1980.06.09
申请人 XEROX CORPORATION 发明人 RONEN, RAM S.
分类号 H01L21/033;H01L21/266;H01L21/336;H01L29/10;H01L29/423;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/033
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