发明名称 Semiconductor device having reduced capacitance and method of fabrication thereof
摘要 A spacer region is provided between the channel stop region and the adjacent portion of the active region of a semiconductor device to reduce the capacitance therebetween. The spacer region may be formed by allowing at least a portion of a conductive line formed on the surface of the device to overlap the active region adjacent the channel stop region.
申请公布号 US4404579(A) 申请公布日期 1983.09.13
申请号 US19800201102 申请日期 1980.10.28
申请人 MOTOROLA, INC. 发明人 LEUSCHNER, HORST
分类号 H01L29/06;(IPC1-7):H01L29/78;H01L29/04;H01L29/34 主分类号 H01L29/06
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