发明名称 |
Electrical probe apparatus |
摘要 |
An electrical probe apparatus for facilitating the testing of printed circuit boards is constructed in a gas tight manner. This allows the printed circuit board to be held by suction without losing vacuum pressure through the probe. A silicon rubber sleeve serves as the vacuum seal, and its resilience urges the probe into firm contact with the circuit under test.
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申请公布号 |
US4403822(A) |
申请公布日期 |
1983.09.13 |
申请号 |
US19800173368 |
申请日期 |
1980.07.29 |
申请人 |
MARCONI INSTRUMENTS LIMITED |
发明人 |
SMITH, JOHN L. |
分类号 |
G01R1/067;G01R1/073;H01R11/18;(IPC1-7):H01R13/24;G01R1/06 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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