发明名称 AUTOMATIC INSPECTING MACHINE FOR MASK SUBSTRATE
摘要 PURPOSE:To completely automate the inspection of a mask substrate by moving by a supporting member drive unit a mask substrate supporting member in parallel with the surface of the substrate, positioning it and analyzing an image signal of a TV camera, thereby obtaining inspection data. CONSTITUTION:A supporting member 1 supports a mask substrate B, and is moved in two directions such as a lateral direction parallel to the surface of the substrate B and a direction perpendicular to the surface of this paper. A supporting member drive unit 4 is engaged with the member 1, and the unit 4 is controlled by a drive controller 5 such as an NC unit. A light emitting unit 6 is disposed obliquely laterally of the member 1, a TV camera 7 is disposed toward the incident point P of the parallel light beam, and controlled by a camera controller 8. The controllers 8, 5 are connected to a main controller 9, which is controlled in the prescribed sequence. The controller 9 also has functions of analyzing the inspection data and the input data, and a television receiver 12, an input unit 13 and an output unit 14 are connected. In this manner, the surface of the mask substrate can be completely automatically inspected.
申请公布号 JPS58153325(A) 申请公布日期 1983.09.12
申请号 JP19820033973 申请日期 1982.03.05
申请人 TOKYO SHIBAURA DENKI KK 发明人 YAMAMOTO SHINICHI;SHIMAZAKI KUNIYOSHI
分类号 G01N21/88;G01N21/94;G01N21/956;G03F1/84;H01L21/027;H01L21/66 主分类号 G01N21/88
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