| 摘要 |
PURPOSE:To manufacture the integrated circuit, which can simply investigate the cause of malfunction by integrally making the test circuit, which is provided with independent input terminal and output terminal and operates apart from a function circuit, contain. CONSTITUTION:A test circuit 141 for monitoring the manufacturing process, a DC characteristic test circuit 142 and an AC characteristic test circuit 143 are each set up the test circuit 140 respectively. These each test circuit is driven by input signals supplied through input signal lines, and the results are given through output signal lines 161-1, 161-2, 161-j. Accordingly, when the function circuit 110 of the integrated circuit 101 is tested and the result is defective, whether malfunction as the test result of the function circuit 110 depends upon the malfunction of the manufacturing process or defective various characteristics, such as DC ones or AC ones or the like can simply be discriminated and classified by testing the independent test circuits 141, 142, 143 provided apart from the function circuit juxtaposed and set up to the function circuit 110. |
