| 摘要 |
PURPOSE:To increase the quantity of information, to easily identify a substance, to elevate the exactitude for identification, and to efficiently execute an analyzing work, by incorporating an analyzing means into an X-ray diffracting device. CONSTITUTION:A driving pulse of a goniometer controlling device 5 is sent to a data processing device 12 and is counted, and an angle position on a goniometer of a sample 3, an X-ray tube 2 and an X-ray detector 6 are detected. A meansuring circuit 7 sends diffracted X-ray intensity data obtained from an output pulse of the detector 6, to the device 12. The device 12 calculates a lattice plane gap from the tube 2 in case when the diffracted X-ray is at a peak, and the angle position of the detector 6, and obtains the data regarding a Debye- Scherrer ring for the sample 3. Also, a condensing optical system 10 condenses light from the sample 3 and makes it incident to a spectrophotometer 11. A spectral reflecting characteristic of the sample 3 is calculated by a ratio of a spectral photometric value of reflected light of the sample 3, to a photometric value in the corresponding wavelength of a standard white plate stored in advance, and a fluorescent characteristic of the sample 3 is obtained by the photometer 11. By these data, a classification of a sample substance is identified. |
