发明名称 INSPECTING DEVICE FOR EMISSION OF MAGNETRON
摘要 PURPOSE:To eliminate poor emission at a high accuracy immediately after the exhausting of a magnetron detecting it depending on a difference between an emission current and that after the heating of an anode when a fixed filament voltage equivalent to 80-90% of the rated value is applied to the magnetron. CONSTITUTION:A magnetron 4 is mounted on a conveyor line 5. An emission current at the first station 6 is measured with a peak current measuring device 17. When the emission current at the station 6 is less than the standard value, the magnetron 4 is removed as defective. The magnetron 4 which passed the standard at the station 6 is shifted to the station 7, at which the filament voltage is set at a fixed value between 80% and 90% of the rated value. The filament current may be at a fixed value in stead of the filament voltage. The anode voltage shall be set at such a value that the anode loss is equal to the normal service requirement.
申请公布号 JPS58142267(A) 申请公布日期 1983.08.24
申请号 JP19820024421 申请日期 1982.02.19
申请人 HITACHI SEISAKUSHO KK 发明人 ISHIDA YOSHIO
分类号 G01R31/24;G01R31/25;H01J25/50 主分类号 G01R31/24
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