发明名称 FIXTURE USED FOR CIRCUIT SUBSTRATE TEST SYSTEM
摘要 PURPOSE:To cope with a future pattern change, by providing preliminarily through holes, through which additional test probes should be inserted, in additional test probe positions other than test probe attaching positions. CONSTITUTION:Test probes 6-8 corresponding to all test points of a preliminarily determined number of kinds of PC board pattern are provided on a well 5 consisting of insulating materials such as a glass-epoxy resin. Terminals 6c-8c of test probes 6-8 are connected to a wiring post 14 through lead-in wires 10- 12. The well 5 is provided preliminarily with through holes 40 through which probes to be added in future are inserted. These through holes 40 can be provided in optional positions other than positions of probes 6-8, are ordinarily, they are provided in positions where parts may be added. Consequently, probes are attached to positions of through holes 40 corresponding to additional test points to cope with the addition of new parts.
申请公布号 JPS58137773(A) 申请公布日期 1983.08.16
申请号 JP19820020397 申请日期 1982.02.10
申请人 EMU AI TECHNICAL SERVICE KK 发明人 OGATA MITSUNORI;MACHINO YASUO;HARASHIMA TAKASHI;AOYAMA KIYOUYA
分类号 G01R31/28;G01R1/073 主分类号 G01R31/28
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