发明名称 ANNEALING OF SEMICONDUCTOR LAYER
摘要 PURPOSE:To prevent penetration of infrared rays into a comparatively deep region, and to prevent destruction of a circuit element formed already in a substrate at the annealing process of the seimconductor layer according to irradiation of infrared rays by a method wherein infrared rays having the prescribed wave length or more are intercepted. CONSTITUTION:A filter 3 is provided between an infrared rays source 2 and the substrate 1 to cut the unnecessary wave length regions. The numeral 4 shows a mirror for convergency of infrared rays on the surface of the substrate. Because infrared rays cut by the filter 3 contain the wave length regions having high heating efficiency, and the temperature rise of the filter absorbing infrared rays thereof is remarkable, the filter is cooled according to the ventilation, etc., so as not to redischarge infrared rays of the long wave lengths. The filter to cut infrared rays on the long wave length side is manufactured according to the method as follows. Glass containing a metal element of a comparatively large quantity absorbs light of the wave length peculiar to the metal element thereof. Accordingly, when the filter is formed of glass containing a properly selected metal, the filter having the desired characteristic can be obtained.
申请公布号 JPS58135630(A) 申请公布日期 1983.08.12
申请号 JP19820018677 申请日期 1982.02.08
申请人 FUJITSU KK 发明人 SAKURAI JIYUNJI
分类号 H01L21/20;H01L21/26;H01L21/268 主分类号 H01L21/20
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