发明名称 LEVEL DETECTING CIRCUIT
摘要 PURPOSE:To enable to make a level detecting circuit integrated with an MOS type semicondutor, by constituting the circuit by two voltage comparison circuits, a logical gate connected to the outputs thereof, two sampling switches, a sampling capacitor, and a hold capacitor. CONSTITUTION:An input signal VI is given to the non-inverted input of a voltage comparison circuit 5, while a hold capacitor voltage VR is given to the inverted input thereof. Meanwhile, a voltage -VR is given to the non-inverted input of a voltage comparison circuit 6, and the voltage of VI is given to the inverted input thereof. A logical sum is taken from outputs (a) and (b) of the voltage comparison circuits 5 and 6 by an OR gate 7. Accordingly, when VI is greater than VR, the output (a) of the voltage comparison circuit 5 is ''Hi'', while the output (b) of the voltage comparison circuit 6 is ''Lo'', and thus an output Vo of the OR gate 7 turns ''Hi''. When VI is less than -VR, the output (b) of the circuit 6 is ''Lo'' while the output (a) of the circuit 5 is ''Lo'', and thus the output Vo of the OR gate turns ''Hi''. Therefore, a circuit having such a constitution operates as a level detecting circuit whose output turns ''Hi'' when VI>VR and VI<VR.
申请公布号 JPS58135969(A) 申请公布日期 1983.08.12
申请号 JP19820018497 申请日期 1982.02.08
申请人 NIPPON DENKI KK 发明人 KURAISHI YOSHIAKI
分类号 G01R19/25;G01R19/165;H02H3/20;(IPC1-7):01R19/165 主分类号 G01R19/25
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