| 摘要 |
PURPOSE:To improve the processing capability of the titled device by executing tests while judging a test to be executed subsequently from the result of a preceding test and a mask information for each test when the operations of a plurality of ICs are tested in the execution of one test. CONSTITUTION:A system controller 1 starts testing from a test 1 of the highest- rank grade stored in a main memory 2. Measuring signals 6 in n sets, which can be given separately and independently, are given by a testing device 4 to n pieces of ICs 5 to be measured, output signals 7 numbering n are compared in the testing device 4 with an expected value generated from this device to determine the appropriateness of the ICs, and thereby the first test is completed. The system controller 1 puts masks on the results of measurement of all the tested ICs in the test currently performed, based on mask informations in this test which are stored in a mask information register 8, and cancels the mask informations according to the result of this masking, while determining a test to be performed subsequently. Based on this determination, a storage start address in the main memory 2 of this test is set in a program counter 9 from a test start address register 3, a test program is loaded from the main memory starting from the address set in the program counter 9, and the subsequent test is conducted. |
