首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
DISPLACEMENT MEASUREMENT DEVICE
摘要
申请公布号
KR830001421(U)
申请公布日期
1983.08.11
申请号
KR19780002745U
申请日期
1978.05.22
申请人
JIIZERU APPARATUS CO.,LTD.
发明人
HIRAIWA SHOOHJOE
分类号
G01B3/22;(IPC1-7):G01B3/22
主分类号
G01B3/22
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Method for the fabrication of multipole magnets
Method for producing furred threads
Refrigerant management control and method for a thermal energy storage system
Method for manufacturing bump leaded film carrier type semiconductor device
Vacuum relief safety valve for a swimming pool filter pump system
Process for etching a semiconductor lead frame
Apparatus and method of mounting electronic components
Removable coupling module for mechanically multiplexing conductors
Method for identifying a nucleotide base pair at a point mutation site in a DNA target using a mismatch repair enzyme
Method of making a semiconductor device
Method for surface treatment of work having plural cylinders with different axial alignments
Sulfur vulcanizable rubber compound
Titanosilicate catalyst particle
Solid colored composition mutable by ultraviolet radiation
System and method for maintaining performance data in a data processing system
Graft preparation table
External cylindrical gearing
SEMICONDUCTOR MOUNTING STRUCTURE
Remote control, link independent A/B switch box with diagnostic loopback
Article carrier