High-voltage CMOS process.

摘要

A high-voltage CMOS process, providing (for 5 micron geometries) both field thresholds and junction breakdowns in excess of 20 volts, wherein only one channel stop implant is used. A double-well process in an epitaxial structure is used. Phosphorus is preferably used and the dopant for the N-tank, and boron is used for the blanket channel stop implant. The boron tends to leach into oxide, and the phosphorus tends to accumulate at the surface, and a high field threshold is achieved over both PMOS and NMOS regions.