| 摘要 |
PURPOSE:To enable a self-test of a logical circuit, by providing a self-test circuit within a logical circuit. CONSTITUTION:In a normal mode, data given from an input line is selected by a data selecting circuit 300 and supplied to a logical circuit 200. In a test mode, a pattern generating circuit 400 is actuated, and the pattern generated from the circuit 400 is selected by the circuit 300 and supplied to the circuit 200. At the same time, a storing circuit 500 is read by using a generated pattern as an address, and a correct answer value is obtained when the generated pattern is fed to the circuit 200 from the circuit 500. Then this correct answer value is compared with the output of the circuit 200 through a dissidence detecting circuit 600. Thus a test is given to the circuit 200. |
