Semiconductor integrated-circuit device with test circuit.

摘要

A semiconductor integrated circuit (IC) I, II device Including therein a test circuit (20). The test circuit operates to distinguish the power source level or ground level occurring at an internal node (N), under testing located inside the semiconductor chip. The test circuit is comprised of a series-connected MIS transistor (24), and MIS diode (25). The gate (22), of the MIS transistor is connected to the internal node (N). The MIS diode is connected to an external input/output (I/O pin (21). The level at the internal node, i.e., the power source level or the ground level, can be distinguished by a first voltage level or a second voltage level applied to the external 1/0 pin, whichever enables a current to be drawn from the external I/O pin.