发明名称 Photoresist stripping composition and method
摘要 An organic photoresist stripping composition especially for use with silicon wafers having an insulating layer and metallization on the wafers contains an organic sulfonic acid and 1,2 dihydroxybenzene. The composition also preferably includes a polar or nonpolar, organic solvent. This composition will remove both positive and negative photoresist from wafers without attack on either aluminum metallization or silicon dioxide insulation layers when used to contact the photoresist on the wafers.
申请公布号 US4395348(A) 申请公布日期 1983.07.26
申请号 US19810323724 申请日期 1981.11.23
申请人 EKC TECHNOLOGY, INC. 发明人 LEE, WAI M.
分类号 C11D3/43;C11D7/24;C11D7/26;C11D7/34;C11D7/50;G03F7/42;(IPC1-7):C11D7/26 主分类号 C11D3/43
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