发明名称 |
TEST METHOD OF MAGNETIC BUBBLE MEMORY |
摘要 |
PURPOSE:To enable simple and accurate evaluation for the memory characteristics, by using a prescribed test data pattern. CONSTITUTION:Each loop of a minor loop group is filled with a test pattern which forms a basic pattern with (n) units of patterns 3 of 1 deg. and (n) units of continuous patterns 4 of 0 deg.. Then (n) is defined as 1 in terms of the upper limit value on a bias magnetic field. Thus a shift, etc. of a magnetic bubble between ''Permalloy '' thin film elements or to an adjacent thin film element are detected within a minor loop. Then the (n) is increased successively from 1 as the bias magnetic field is decreased. Then the characteristics of a magnetic bubble memory can be evaluated in a simple and accurate way from the upper limit value of the bias magnetic field. |
申请公布号 |
JPS58121192(A) |
申请公布日期 |
1983.07.19 |
申请号 |
JP19820003120 |
申请日期 |
1982.01.11 |
申请人 |
NIPPON DENSHIN DENWA KOSHA |
发明人 |
YAMAGUCHI NAKAHIKO |
分类号 |
G11C11/14;G11C29/00;G11C29/04;G11C29/56 |
主分类号 |
G11C11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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