发明名称 TEST METHOD OF MAGNETIC BUBBLE MEMORY
摘要 PURPOSE:To enable simple and accurate evaluation for the memory characteristics, by using a prescribed test data pattern. CONSTITUTION:Each loop of a minor loop group is filled with a test pattern which forms a basic pattern with (n) units of patterns 3 of 1 deg. and (n) units of continuous patterns 4 of 0 deg.. Then (n) is defined as 1 in terms of the upper limit value on a bias magnetic field. Thus a shift, etc. of a magnetic bubble between ''Permalloy '' thin film elements or to an adjacent thin film element are detected within a minor loop. Then the (n) is increased successively from 1 as the bias magnetic field is decreased. Then the characteristics of a magnetic bubble memory can be evaluated in a simple and accurate way from the upper limit value of the bias magnetic field.
申请公布号 JPS58121192(A) 申请公布日期 1983.07.19
申请号 JP19820003120 申请日期 1982.01.11
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 YAMAGUCHI NAKAHIKO
分类号 G11C11/14;G11C29/00;G11C29/04;G11C29/56 主分类号 G11C11/14
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