| 摘要 |
PURPOSE:To measure again a component density automatically, by switching a fraction sensitivity corresponding to the abnormality of fraction of an abnormal substance to be inspected, in a densitometer for measuring the fraction density of a sample wherein a detecting unit of an optical system is moved in the directions of longitudinal and lateral axes in relation to the sample. CONSTITUTION:The density is measured for all substances a1-an to be inspected, numbering n, which are made to migrate on one migration film 1, with the fraction sensitivity selected beforehand. Thereafter, a component density is measured again for an abnormal substance a2 to be detected. Based on a memory value stored in CPU, a sample conveying table 11 is controlled to move at a distance l1 in the direction of an X axis from the position of the substance a1 to be inspected as a datum point, and thereby a detecting unit 12 of an optical system is positioned at the position of the abnormal substance a2. The fraction sensitivity is switched from a low level to high automatically in a prescribed width according to the number of fractions of the substance a2 and is set. |
