发明名称 Method and device for testing metallic samples for examination by spectral analysis
摘要 Before being examined by spectral analysis the test surface of metallic samples has to be checked to see whether it is crack- and blowhole-free. For this purpose, after the solidification temperature has been reached all the areas of the test surface of the cooling samples are tested for uniform infrared emission, which indicates, regardless of the thickness of the scale layer, whether the test surface is free of cracks and blowholes. Satisfactory samples are then further cooled to the temperature at which the examination by spectral analysis is carried out in such a way that they remain crack-free.
申请公布号 DE3200007(A1) 申请公布日期 1983.07.14
申请号 DE19823200007 申请日期 1982.01.02
申请人 KLOECKNER-WERKE AG 发明人 HENNING,NORBERT;HILLEBRAND,FRIEDHELM
分类号 G01N21/67;G01N25/72;(IPC1-7):G01N21/88;C21C5/30;G01N1/28 主分类号 G01N21/67
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