发明名称 X-ray crystal spectrometer and a method of evaluating measurement results obtained with an x-ray crystal spectrometer
摘要 An x-ray crystal spectrometer consists of a device for producing an electron beam for irradiating a sample and has a chamber for receiving a crystal, a proportional counter and a semiconductor detector for detecting x-rays. The crystal and the semiconductor detector are approximately within the same polychromatic radiation, so that the evaluation can be carried out with a multichannel analyser taking account of a single geometrical position of the sample with respect to the crystal or the semiconductor detector. All in all, this simplifies the analysis and improves the quantitative evaluation.
申请公布号 DE3126539(A1) 申请公布日期 1983.07.14
申请号 DE19813126539 申请日期 1981.07.04
申请人 DIENWIEBEL, INGO, DR.;DIENWIEBEL, ROSEMARIE, 4600 DORTMUND, DE 发明人 DIENWIEBEL, INGO, DR.;DIENWIEBEL, ROSEMARIE, 4600 DORTMUND, DE
分类号 G01N23/225;H01J37/256;(IPC1-7):G01N23/22 主分类号 G01N23/225
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