发明名称 |
Method for erasing data of a non-volatile semiconductor memory integrated circuit |
摘要 |
A non-volatile semiconductor integrated circuit has floating poly-silicon gates on the channel regions of memory cells. The information electronically stored in said floating gates is erased by the irradiation of an X-ray with predetermined amount. The writing step prior to X-ray irradiation causes the uniform erase of entire memory cells. The circuits other than memory cells are protected by a shielding coating against the X-ray irradiation.
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申请公布号 |
US4393479(A) |
申请公布日期 |
1983.07.12 |
申请号 |
US19800207179 |
申请日期 |
1980.11.17 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
DU, NGUYEN T.;ASAO, AKIHIDE |
分类号 |
G11C16/18;(IPC1-7):G11C13/00 |
主分类号 |
G11C16/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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