发明名称 SIMPLE TEST SYSTEM FOR TDM-FDM CONVERTER
摘要 PURPOSE:To attain a simple test system for a TDM-FDM converter, by loading a simple system test device in which each channel carriers wave is switched to make it a test signal of a required channel in a group band, on the same frame as a main device. CONSTITUTION:In setting a contact a rotary switch in order from CH1 to CH12, a relay 27 is operated first, and contacts rla1, rla2 form a folding loop. In the system test, a test signal of a simple oscillator 12 is modulated with the carrier wave of a channel corresponding to the CH1 at a modulator 26-1. This modulated wave is outputted to a hybrid 33 via a TDM-FDM converter and the contacts rla2, rla1 from a hybrid 32. This output is demodulated into the test signal at a demodulator 22-2, and the transmission characteristics are checked at a level discrimination circuit 18-1. If the transmission characteristics are defective, a switch 28 is turned off. Thus, the folding loop of the system test is released for failure processing.
申请公布号 JPS58114538(A) 申请公布日期 1983.07.07
申请号 JP19810210494 申请日期 1981.12.26
申请人 FUJITSU KK 发明人 MIWA SHINICHI;MUROZAKI MIKIO
分类号 H04J1/16;H04J3/14;H04J4/00 主分类号 H04J1/16
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