Method for testing an electromagnetic action device, particularly a relay with contact armatures encapsulated in an opaque housing, by representing and/or evaluating their armature movement and arrangement for carrying out the method

摘要

It is known that the change in inductance, which is produced by the armature movement when an electromagnetic action device is excited or deexcited, reacts on the exciter circuit (armature reaction). To test the relay characteristics, the signal component corresponding to this armature reaction is extracted and separately imaged and/or brought into relation with an excitation quantity independent of the armature movement. The said signal component provides information on the variation of the movement of the armature or of the armatures in the case of double-armature contacts with time. <IMAGE>