发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain a semiconductor device wherefrom an active element array, with excellent and stable operational characteristic and a large area and length can be obtained and which allows the light incidence from the element side and substrate side according to necessity, by forming a polycrystalline Si film at a substrate temperature within the range of operational temperatures on a glass substrate or a ceramic substrate, etc. CONSTITUTION:Window opening of source and drain regions is performed on an SiO2 film 3, BF2<+> ions of the energy 150KeV are implanted at a dosage of 3X10<15>/cm<2> and heat-treated at 550 deg.C for 100min, and thereby P<+> layers 4 are formed on source and drain regions. Next, the SiO2 film is removed by leaving a field oxide film 5, and again an SiO2 film 6 is adhered into the thickness of 2,000Angstrom for a gate oxide film by a vapor growing method. Further, after opening electrode contact holes by a photoetching process and evaporating Al over the entire surface, the Al is processed resulting in the formation of a source electrode 7, a drain electrode 8, and a gate electrode 9. Thereafter, a heat treatment at 400 deg.C for 30min is performed in H2 atmosphere.
申请公布号 JPS58112363(A) 申请公布日期 1983.07.04
申请号 JP19820226122 申请日期 1982.12.24
申请人 HITACHI SEISAKUSHO KK 发明人 MATSUI MAKOTO;SHIRAKI YASUHIRO;KATAYAMA YOSHIFUMI;TSUKADA TOSHIHISA;MARUYAMA EIICHI
分类号 H01L21/203;H01L27/14;H01L27/146 主分类号 H01L21/203
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