| 摘要 |
PURPOSE:To interrupt an error current at an input dielectric strength test and to improve the measuring accuracy of leakage current, through the control of a gate voltage, in an IC input circuit provided with MOSFETs functioning as pull- up or pull-down resistors. CONSTITUTION:An input terminal Ti is connected to a test power supply VFM and a leakage current measuring ammeter A at the measurement of input dielectric test. The input terminal Ti is connected to an input buffer 1 at the inside of the IC and also to the source of a pull-up MOSFET 2. The gate of a pull-up MOSFET 2 is connected to a control terminal Tc, and this terminal is grounded at the measurement of input dielectric test, the pull-up MOSFET2 is cut off and no measuring error is taken place at the leakage current. Normally, the control terminal Tc is connected to a power supply line. |
