| 摘要 |
PURPOSE:To improve the test efficiency, by providing a simple test function for the microprocessor, and disconnecting internal or external circuit of a processor, and making classification of failure possible. CONSTITUTION:A test program is stored in advance in an ROM1 of a microprocessor, and the content of storage is read out according to the access of a control section 2. While each mode of test is executed at the control section 2, after each circuit function of the inside and outside of the processor is once disconnected according to the test program, the required parts is connected and a display signal is outputted from an output control circuit 3 and the further test is interrupted and stopped. The processor is provided with an interruption control 5 connected to an external peripheral circuit, a bus control 6 and a timing control 7 and the like, then whether the inside of the processor and each function with the peripheral circuits is correctly operated is tested separately, and the result is displayed with classification. |
