发明名称 TENSILE TESTING DEVICE AT LOW TEMPERATURE
摘要 PURPOSE:To realize a tensile test with high reliability, by heat-insulating a test piece at its testing area and jetting a cooled fluid to both holder parts to cool evenly the test piece. CONSTITUTION:A cooled fluid controlled down to a prescribed temperature is jetted through nozzles 12a and 12b, and a test piece 1 is cooled from its holding edge parts 1a and 1b through a testing area 4. Then holder plates 3a and 3b are moved up and down when the temperatures detected by temperature sensors 13a and 13b reach the set value, respectively. As a result, the tensile force is transmitted for a test while chucks 2a and 2b are being held tight. In such a way of test, the holding edge part responding to a tensile holding part A where heat intrudes easily from the outside is cooled. Thus the temperature distribution of the piece 1 can be assuredly equalized. At the same time, no breakdown arises at the holding edge part.
申请公布号 JPS58109832(A) 申请公布日期 1983.06.30
申请号 JP19810208297 申请日期 1981.12.23
申请人 HOKUSAN:KK 发明人 TSUCHIDA YASUHIRO;KAMATA NAOKI
分类号 G01N3/18;(IPC1-7):01N3/18 主分类号 G01N3/18
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